Prof. Chae’s paper, “A 0.033-mm2 21.5-aF to 114.9-aF Resolution Continuous-Time  Capacitance-to-Digital Converter Achieving Parasitic Capacitance Immunity Up to 480 pF”, has been published in IEEE Journal of Solid-State Circuits (JSSC), one of the most highly-ranked journals in ‘Integrated Circuits Design’ field (Impact Factor 6.12).
This work was led by Hyeyeon Lee (Ph.D. Candidate) as the first author and Prof. Youngcheol Chae as the corresponding author. Also, prof. Inhee Lee in University of Pittsburgh participated in this study.