The research team led by Professor Young-Cheol Chae from the Department of Electrical and Electronic Engineering at Yonsei University has developed the world's first wafer-scale, high-speed, ultra-low-dose, high-resolution SPAD (Single Photon Avalanche Diode) X-ray sensor. This technology has been recognized for its significance and was selected as a presentation paper at the IEEE VLSI Symposium, one of the most prestigious conferences in the field of system semiconductor design, and was presented on June 18th.

Original article : https://edu.donga.com/?p=article&ps=view&at_no=20240618102451400155