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Title
Seminar [07/09] Single-Photon Counting and Time-of-Flight Sensors: Fundamentals, Applications, and Trends
Date
2018.07.03
Writer
전기전자공학부
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< BK21+ BEST Seminar Series Announcement> 


Time and Date : 11:00 ~ 12:00 Monday 07/09/2018

Place : C716, Engineering Building #3

Title : Single-Photon Counting and Time-of-Flight Sensors: Fundamentals, Applications, and Trends

Abstract:

Single-photon counting and time-of-flight (TOF) sensors are very useful tools in a large number of applications, from light detection and ranging (LiDAR) to biomedical imaging, from mobile phone applications to time-resolved Raman spectroscopy. Examples include advanced driver-assistance systems (ADAS), self-driving cars, drone delivery services, autonomous robots, space navigation, 3D face and gesture recognition, TOF positron emission tomography (TOF PET), fluorescence-lifetime imaging microscopy (FLIM), superresolution microscopy, near-infrared optical tomography (NIROT), etc. Single-photon avalanche diodes (SPADs) in standard CMOS technology have been receiving a great amount of attention from both scientific and industrial communities as a key technology for the single-photon counting and TOF sensors, because they can provide single-photon detection and photon-counting capability together with very useful functionalities such as time-of-flight evaluation and histogram processing, based on the digital nature of their output and extremely high gain from the Geiger-mode operation, in a cost-effective manner. Recently, more and more advanced CMOS technologies have become available for the fabrication of SPAD-based single-photon counting and TOF sensors, including technology nodes smaller than 65 nm, CMOS image sensor (CIS) processes, processes providing image sensor and/or SPAD dedicated layers, as well as 3D-stacking technologies. The latter in particular are attracting significant attention because they hold the promise for better sensitivity and more functionality per pixel. This talk will cover fundamentals of the SPADbased single-photon counting and TOF sensors, emerging applications based on the sensors, and cutting-edge technologies. A brief outlook on the future of these sensors will conclude the talk.



Presenter: Prof. Lee, Myung-Jae / Ecole Polytechnique Federale de Lausanne, Switzerland

Host: Prof. Choi, Woo Young, Yonsei EEE