- Title
- Prof. Shin's Research group published a paper in IEEE Transactions on Industrial Electronics.
- Date
- 2018.09.16
- Writer
- 전기전자공학부
- 게시글 내용
-
※ Neural network based fault localization technique for shielded cable was accepted by international journal “IEEE Transactions on Industrial Electronics”.- Impact Factor: 7.168
- Rank: 1/60 (Automation & Control System), 12/262 (Electrical & Electronic)
※ Prof. Yong-June Shin (Corresponding Author) and Gu-Young Kwon (First Author) led this research, and Chun-Kwon Lee (Co Author) participated.
- Attachments
- shin.jpg