Prof. Yun’s Semiconductor Engineering Lab. developed the methodology for Tunneling FET (TFET) based pixel source follower of CMOS Image Sensor for improved linearity and high signal-to-noise ratio compared with the conventional MOS SF and can be applied for the mobile CIS applications. The results were published as a paper in IEEE Sensors Journal (IF = 4.3, JCI percentile = 77.0 %)

This study was mainly led by Haewon Lee under the supervision of Prof. Ilgu Yun (School of Electrical and Electronic Engineering)